Bannar

Combinatorial methods are a promising modern approach to software testing. In particular, pairwise testing, which requires testing all pairs of possible values for any pair of input parameters, has shown a high level of fault detection. A more general approach, t-wise testing, which is an extension of pairwise testing for t from 3 to 6, considers a combination of any t input parameter values to be covered by at least one test. It requires more test cases but provides even better results. Combinatorial testing (CT) is also an effective approach to testing hardware and software configurations. The CTA 2017 workshop aims to bring together researchers and practitioners working on CT. The workshop will provide a platform for the discussion of problems in the theory and practice of CT with a focus on its applications in different domains. Participants will be able to use this opportunity to share their knowledge through informal discussions, develop new ideas, and establish new collaborations on CT topics.


The topics of interest include, but are not limited to:


  • Theoretical basis of CT
  • Methods, models, and algorithms for combinatorial test generation
  • CT for configuration testing
  • CT for input testing
  • CT for security testing
  • Types of faults detected by CT
  • CT effectiveness
  • CT coverage
  • Comparison of different CT methods
  • Comparison of CT with other testing approaches
  • Combining CT with other testing approaches
  • Experimental evaluation of CT
  • Tools for combinatorial test generation
  • Tools for measuring CT coverage
  • Combinatorial test automation
  • Case studies and industrial reports on CT applications
  • Analysis of practical problems during CT application
  • Domain-specific applications of CT

Proceedings


At least one author of each accepted paper (including panelists’ position statements) must register with the full fee and present at the workshop in order for the paper to be included in the QRS 2017 Supplemental Proceedings. Papers will also be submitted to the IEEE Xplore database and indexed by all the abstracting and indexing partners (such as the EI Compendex).

Journal Special Issue (TBA)




Best Paper Award


At least one award will be presented. Authors will receive a certificate signed by the President of the IEEE Reliability Society and the Organizers of CTA 2017.

Panelists Solicitation (TBA)



Important Dates


    April 15, 2017 (extended)       Submission deadline
    May 25, 2017       Author notification
    June 5, 2017       Camera-ready dues
    July 25-29, 2017       Workshop

Submission


Authors are invited to submit original, unpublished research papers as well as industrial practice papers. Simultaneous submissions to other publications and conferences are not permitted. Detailed instructions for electronic paper submission, panel proposals and review process can be found at http://paris.utdallas.edu/qrs17/.


The length of a camera ready paper will be limited to eight pages, including the title of the paper, the name and affiliation of each author, a 150-word abstract, and up to 6 keywords.


Authors must follow the IEEE Computer Society Press Proceedings Author Guidelines to prepare papers. At least one of the authors of each accepted paper is required to pay full registration fee and present the paper at the workshop. Arrangements are being made to publish selected accepted papers in reputable journals. The submissions must be in PDF and uploaded to the conference submission site.



  Click here to submit your papers to CTA 2017




General Chair


Sergiy Vilkomir East Carolina University USA

Program Chair


Junhua Ding East Carolina University USA

Program Committee


Bestoun S. AhmedCzech Technical University in PragueCzech Republic
Benoit BaudryIRISA – INRIAFrance
Lydie du BousquetUniversity Joseph FourierFrance
Josip BozicGraz University of TechnologyAustria
Renee BryceUniversity of North TexasUSA
Miroslav BuresCzech Technical University in PragueCzech Republic
Eun-Hye ChoiNational Institute of Advanced Industrial Science and TechnologyJapan
Eitan FarchiIBM Haifa Research LabIsrael
Loreto Gonzalez-HernandezUniversity of SkövdeSweden
Rubing HuangJiangsu UniversityChina
Takashi KitamuraNational Institute of Advanced Industrial Science and TechnologyJapan
Peter M. KruseBerner & Mattner SystemtechnikGermany
Richard KuhnNational Institute of Standards and TechnologyUSA
Jim LawrenceGeorge Mason UniversityUSA
Changhai NieNanjing UniversityChina
Gilles PerrouinUniversity of NamurBelgium
Eduardo Rodriguez-TelloCINVESTAVMexico
Preeti SatishDayananda Sagar College of EngineeringIndia
Maria SpichkovaRMIT University Australia
Thomas ThümTU BraunschweigGermany
Tatsuhiro TsuchiyaOsaka UniversityJapan
Cemal YılmazSabanci UniversityTurkey
Kamal Z. ZamliUniversity Malaysia PahangMalaysia

Web Masters


Shou-Yu Lee University of Texas at Dallas USA
Xuelin Li University of Texas at Dallas USA


PC Login


Please click here to log in your PC account for CTA 2017.



Workshop Venue


CTA 2017 will be held in conjunction with QRS 2017 at Prague, Czech Republic. Please visit the QRS 17 website for further information.



General Inquiries


For more detailed and updated information, please contact Professor Sergiy Vilkomir at VILKOMIRS@ecu.edu or Professor Junhua Ding at DINGJ@ecu.edu.



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CTA 2017 Program


  Click here to download the conference program.