2009
The following articles were published in the IEEE Transactions on Reliability,
pp. 449-482, Volume 59, Number 3, September 2010
- Ticking Time-Bombs in Electronics and Photonics Systems and Networks
by Nihal Sinnadurai
- Some Observations About Design for Six Sigma and Design for Reliability
by Gary Jing
- Representativeness Models of Systems: Smart Grid Example
by Norman Schneidewind
- Concerns Related to EMC Compliance
by Mark I. Montrose
- Introducing Reliability Economics Safeguarding the Economy in the Same Way We Do Products
by Alec Feinberg
- A Research Agenda for Software Reliability
by Arbi Ghazarian
- Major Power Outages in the US, and around the World
by James McLinn
- Technology Trends in Mobile Communication: How Mobile are Your Data?
by Christian K. Hansen
- Exploratory Testing for Mission Critical, Real-Time, and Embedded systems
by Phil Laplante
- The Business Value of Information Technology is Now a Competitive Differentiator
by Dave Hendrickson
- Major Bridge Collapses in the US, and Around the World
by James McLinn
- SynJet® Thermal Management Technology Increases LED Lighting System Reliability
by Markus M. Schwickert
- Vulnerability Assessment of Critical Infrastructures
by Enrico Zio and Wolfgang Kroger
- Function Extraction (FX) Technology: Computing the Behavior of Software
by Richard C. Linger
- NXT Battery Voltage Experiment
by Ian Fore, David Trost, Jonathan Trost and Steve Trost
- Reliability Standards Update
by Lou Gullo
- The Role of Software in Recent Catastrophic Accidents
by W. Eric Wong, Vidroha Debroy and Andrew Restrepo
- Software Fault Localization
by W. Eric Wong and Vidroha Debroy
- The Evolution of Fine-Grain Malware Behavior Analysis, From Static to Dynamic
by C.W. Wang and Shiuhpyng Shieh
- US Infrastructure Reliability: The Disney Monorail Catastrophe
by Joseph A. Childs
- Software Reliability Issues: Concept Map
by Goutam Kumar Saha
